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A Bibliography on Capacity Modeling for Semiconductor Manufacturing
Section 36: Variability and Uncertainty
 | T. Bielecki and P. R. Kumar, "Optimality of Zero-Inventory Policies
for Unreliable Manufacturing Systems," Operations Research, Vol. 36,
No. 4, 532-541, 1988. |
| A. B. Bondi and W. Whitt, "The Influence of Service-Time Variability
in a Closed Network of Queues," Performance Evaluation, Vol. 6,
219-234, 1986. |
| P. Cogez, "The Effect of Uncertainty on Production Release
Policies," Engineering Systems Research Center Report No. 90-25, the
University of California at Berkeley, 1990. |
| E. V. Denardo and C. S. Tang, "Control of a Stochastic Production
System With Estimated Parameters," Management Science, Vol. 43, No. 9,
1296-1307, 1997. |
| G. Foo and D. J. Friedman, "Variability and Capability: The
Foundation of Competitive Operations Performance," AT&T Technical
Journal, July/August 1992, 2-9. |
| H. Fromm, "Some Remarks on Cycle Time, Variability, Zero Inventories,
and Costs in Microelectronics Manufacturing Lines," IBM Technical
Report TR 28.167, 1992. |
| S. A. Hendryx, "Manufacturing Execution: Theory and Concepts,"
AT&T Technical Journal, July/August 1990, 33-52. |
| Y.-F. Hung and C.-B. Chang, "Determining Safety Stocks for Production
Planning in Uncertain Manufacturing," International Journal of
Production Economics, Vol. 58, No. 2, 199-208, 1999. |
| J. H. Jacobs, L. F. P. Etman, E. J. J. van Campen, J. E. Rooda,
"Characterization of Operational Time Variability using Effective
Process Times," IEEE Transactions on Semiconductor Manufacturing, Vol.
16, No. 3, 511-520, 2003. |
| S. S. Johal, "Non-Linearity and Randomness in a Semiconductor Wafer
Fab," Proceedings of the 1996 IEEE/SEMI Advanced Semiconductor
Manufacturing Conference, Cambridge, MA, 2-6, 1996. |
| H. V. Kher and L. D. Fredendall, "Comparing Variance Reduction to
Managing System Variance in a Job Shop," Computers & Industrial
Engineering, Vol. 46, No. 1, 101-120, 2004. |
| D. S. Kim and J. M. Alden, "Estimating the Distribution And Variance
Of Time To Produce A Fixed Lot Size Given Deterministic Processing Times And
Random Downtimes," International Journal of Production Research, Vol.
35, No. 12, 3405-3414, 1997. |
| S.-S. Ko, R. Serfozo, A. Sivakumar, "Reducing Cycle Times in Manufacturing and Supply Chains by Input and Service Rate Smoothing," IIE Transactions, Vol. 36, No. 2, 145-153, 2004. |
| J. W. Li, "Improving the Performance of Job Shop Manufacturing with
Demand-Pull Production Control by Reducing Set-Up/Processing Time
Variability," International Journal of Production Economics, Vol. 84,
No. 3, 255-270, 2003. |
| S. C. H. Lu, D. Ramaswamy, and P. R. Kumar, "Efficient Scheduling
Policies to Reduce Mean and Variance of Cycle-Time in Semiconductor
Manufacturing Plants," IEEE Transactions on Semiconductor
Manufacturing, Vol. 7, No. 3, 1994, 374-380. |
| J. W. Patterson, L. D. Fredendall, C. W. Craighead, “The Impact of
Non-Bottleneck Variation in a Manufacturing Cell,” Production Planning and
Control, Vol. 13, No. 1, 76-85, 2002. |
| L. Sattler, S. O'Connor, M. Hallinan and T. Finucane, "Techniques for
Analyzing Cycle Time Variability in Fab and Probe," Proceedings of the
1999 Advanced Semiconductor Manufacturing Conference (ASMC), Boston, MA,
1999. |
| A. Schoemig, "On The Corrupting Influence Of Variability In
Semiconductor Manufacturing," Proceedings of the 1999 Winter Simulation
Conference, 1999. |
| S. Sokhan-Sanj, G. Gaxiola, G. T. Mackulak, and F. B. Malmgren, "A
Comparison of the Exponential and the Hyperexponential Distributions for
Modeling Move Requests in a Semiconductor Fab," Proceedings of the 1999
Winter Simulation Conference, 1999. |
| C. S. Tang, "The Impact of Uncertainty on a Production Line,"
Management Science, Vol. 36, No. 12, 1518-1531, 1990. |
| G. D. Taylor and S. S. Heragu, "A Comparison of Mean Reduction Versus
Variance Reduction in Processing Times in Flow Shops," International
Journal of Production Research, Vol. 37, No. 9, 1919-1934, 1999. |
| Kan Wu, "An Examination of Variability and its Basic Properties for a Factory," IEEE Transactions on Semiconductor Manufacturing, Vol. 18, No. 1, 214-221, 2005. Author is from IE Dept., Inotera Memories Inc., Taoyuan, Taiwan. |
| H. J. Yoon and D. Y. Lee, "A Control Method To Reduce The Standard
Deviation Of Flow Time In Wafer Fabrication," IEEE Transactions in
Semiconductor Manufacturing, Volume 13, No. 3, 389-392, 2000. |
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