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A Bibliography on Capacity Modeling for Semiconductor Manufacturing
Section 8: Cost Modeling
 | R. Akella, S. M. Datar, and P. Nandakumar, "Models for Measuring and
Accounting for Cost of Conformance Quality," Carnegie Mellon
University, 1989. |
| F. J. Arcelus, J. Bhadury, and G. Srinivasan, "On The Interaction
Between Indirect Cost Allocations And The Firm's Objectives," European
Journal of Operational Research, Vol. 102, No. 3, 445-454, 1997. |
| F. J. Arcelus, J. Bhadury, and G. Srinivasan, "On The Interaction
Between Indirect Cost Allocations And The Firm's Objectives," European
Journal of Operational Research, Vol. 102, No. 3, 445-454, 1997. |
| B. Atwater and M. L. Gagne, "The Theory of Constraints Versus
Contribution Margin Analysis for Product Mix Decisions," Journal of
Cost Accounting, 6-15, Jan/Feb 1997. |
| R. J. Baseman, W. Grey, S. J. Hood, C. A. Kovac, and R. C. Brilla,
"Cycle Time Driven Inventory Cost Analysis," Proceedings of the
IBM International Manufacturing Productivity Symposium, IBM East Fishkill,
New York, October 12-15, 1993. |
| R. Carnes and M. Su, "Long Term Cost of Ownership: Beyond Purchase
Price," Proceedings of the IEEE/SEMI International Semiconductor
Manufacturing Science Symposium, 39-43, 1991. |
| F. Chance and J. K. Robinson, "Integrating Cost, Capacity, and
Simulation Analysis," 1997. Published in the Wright Williams &
Kelly corporate newsletter. |
| D. L. Dance, "Estimating the Cost of Ownership for Test and
Metrology," Proceedings of the SEMI Manufacturing Test Conference,
18-22, 17, 1993. |
| D. L. Dance, R. W. Burghard, and R. J. Markle, "Reducing Process
Equipment Cost of Ownership Through In Situ Contamination Prevention and
Reduction," Microcontamination, 21-23, 64, May 1992. This article is
the first in a series of four. The second (June 1992, pg. 33-36) describes
an application to tungsten-etch equipment. The third (Sept. 1992, pg. 27-29)
describes an application to ion implantation. The fourth (Oct. 1992, pg.
23-25) describes an application to tungsten deposition equipment. |
| N. S. Davis, "Capacity-Based Product Costing," 33rd
International Conference Proceedings of the American Production and
Inventory Control Society, 189-192, 1990. |
| N. Dayanand and R. Padman, "On Modelling Payments In Projects,"
Journal of the Operational Research Society, Vol. 48, No. 9, 906-918, 1997. |
| T. D. Fry, D. C. Steele and B. A. Saladin, "The Use Of Management
Accounting Systems In Manufacturing," International Journal of
Production Research, Vol. 36, No. 2, 503-525, 1998. |
| D. Gerwin, "Increasing Semiconductor Manufacturing's Strategic Value
to a Firm," IEEE Transactions on Engineering Management, Vol. 42, No.
2, 112-118, 1995. |
| D. A. Hicks, "Evolving Complexity and Cost Dynamics in the
Semiconductor Industry," IEEE Transactions on Semiconductor
Manufacturing, Vol. 9, No. 3, 294-302, 1996. |
| G. Ioannou and W. G. Sullivan, "Use of Activity-Based Costing and
Economic Value Analysis for the Justification of Capital Investments in
Automated Material Handling Systems," International Journal of
Production Research, Vol. 37, No. 9, 2109-2134, 1999. |
| Y. Iwata and S. C. Wood, "Effect of Fab Scale, Process Diversity and Setup on Semiconductor Wafer Processing Cost," IEEE 2000 Advanced Semiconductor Manufacturing Conference (ASMC '00), 237-244, 2000. The authors are from Stanford Univ., CA. |
| Y. Iwata and S. C. Wood, "Simple Cost Models of High-Process-Mix
Wafer Fabs at Different Capacities," IEEE Transactions on Semiconductor
Manufacturing, Vol. 15, No. 2, 267-273, 2002. |
| H. R. Jang, T. Nose, S. Kuriyama, and Y. Adachi, "Cost Management
System Based On EUC Concept," Computers & Industrial Engineering,
Vol. 33, No. 3-4, 653-656, 1997. |
| D. W. Jimenez and H. Ignatius, "The Application of Cost of Ownership
Simulation to Wafer Sort and Final Test," Proceedings of the SEMI
Manufacturing Test Conference, 5-13, 1993. |
| U. Karmarkar and S. Kekre, "Manufacturing Configurations, Capacity
and Mix Decisions Considering Operational Costs," Journal of
Manufacturing Systems, Vol. 6, No. 4, 315-324, 1987. |
| R. L. LaFrance and S. B. Westrate, "Cost of Ownership: The Supplier's
View," Solid State Technology, July 1993, 33-37, 1993. |
| C.-Z. Liao, Y.-F. Chang, D. Yang, and B. Jiang, "Strategy and Benefit Analysis of Water Saving in 8" Semiconductor Fab," Proceedings of the 2004 Semiconductor Manufacturing Technology Conference, 54-58, 2004. The authors are from United Microelectronics Corp., Hsinchu, Taiwan. |
| A. Locascio, "Design Economics for Electronics Assembly,"
Engineering Economist, Vol. 44, No. 1, 64-77, 1999. |
| W. Maguire and D. Heath, "Capacity Management for Continuous
Improvement," Journal of Cost Management, 26-31, Jan/Feb 1997. |
| W. Maly, H. Jacobs, and A. Kersch, "Estimation of Wafer Cost for
Technology Design," Proceedings of the 1993 IEDM Conference,
35.6.1-35.6.4, Washington, DC, 1993. |
| D. N. Maynard, D. S. Kerr, and C. Whiteside, "Cost of Yield," IEEE 2003 Advanced Semiconductor Manufacturing Conference (ASMC '03), 32-35, 2003. Authors are from IBM Microeletronics Div., Essex Junction, VT, USA. |
| S. Miraglia, C. Blouin, G. Boldman, S. Judd, T. Richardson, and D. Yao, "ABC Modeling: Advanced Features [Semiconductor Manufacturing]," IEEE 2002 Advanced Semiconductor Manufacturing Conference (ASMC '02), 336-339, 2002. The authors are from IBM Microelectron. Div., Essex Junction, VT. |
| H. Nakatsuka, "Derivation and Implication of a Novel DRAM Bit Cost
Model," IEEE Transactions on Semiconductor Manufacturing, Vol. 15, No.
2, 279-284, 2002. |
| K. Palaka, S. Erlebacher, and D. H. Kropp, "Lead-Time Setting,
Capacity Utilization, And Pricing Decisions Under Lead-Time Dependent
Demand," IIE Transactions, Vol. 30, No. 2, 151-163, 1998. |
| N. G. Pierce and T. Yurtsever, "Value-Based Dispatching for Semiconductor Wafer Fabrication," IEEE 2000 Advanced Semiconductor Manufacturing Conference (ASMC '00), 245-249, 2000. The authors are from Adv. Products Res. & Dev. Lab., Motorola, Austin, TX. |
| R. Plieninger, U. Muller, H. Ehm, and W. Reczek, "Cost Reduction using Systematic Target Setting of the Reference Fab Methodology," IEEE 2001 Advanced Semiconductor Manufacturing Conference (ASMC '01), 17-20, 2001. The authors are from Infineon Technol. AG, Munchen. |
| R. Sandell and N. G. Pierce, "A Hierarchical Approach to Cost
Analysis for Next Generation Semiconductor Processes," Proceedings of
the International Conference on Modeling and Analysis of Semiconductor
Manufacturing (MASM 2002), Editors G. T. Mackulak, J. W. Fowler, and A.
Schoemig, Tempe, AZ, April 10-12, 2002. 169-174. Also published in IEEE 2002 Advanced Semiconductor Manufacturing Conference (ASMC '02), 330-335, 2002. The authors are from Adv. Products R&D Lab., Motorola Inc., Austin, TX. |
| C. R. Shyamsundar, "A Profit Maximization Approach to VLSI
Fabrication Scheduling," Research Report No. CMUCAD-89-59, SRC-CMU
Research Center for Computer-Aided-Design, Carnegie Mellon University, 1989. |
| K. K. Sinha, W. W. Cooper, and R. S. Sullivan, "Accounting for
Complexity in Costing High Technology Manufacturing," European Journal
of Operations Research, Vol. 85, No. 2, 316-326, 1995. |
| S. Y. Sohn and H. U. Moon, "Cost of Ownership Model for Inspection of
Multiple Quality Attributes," IEEE Transactions on Semiconductor
Manufacturing, Vol. 16, No. 3, 565-571, 2003. |
| C. J. Sweeney, "Multi Product Reticle (MLR) Reducing Product Cost On
Leading Edge Technologies," Proceedings of the 2004 International
Symposium on Semiconductor Manufacturing (ISSM 2004), Tokyo, Japan, 2004. |
| S. H. G. Teng and S. S. Garimella, "Manufacturing Cost Modeling In
Printed Wiring Board Assembly," Journal of Manufacturing Systems, Vol.
17, No. 2, 87-96, 1998. |
| C. K. G. Tjiang, Y. S. Chang, and C. B. Besant, "Manufacturing Cost
Analysis System in Semiconductor Enterprises," International Journal of
Industrial Engineering - Theory, Applications, and Practice, Vol. 8, No. 2,
131-141, 2001. |
| R. L. Tobin, "A Fast Interactive Solution Method for Large Capital
Expenditure Selection Problems," European Journal of Operational
Research, Vol. 116, No. 1, 1-15, 1999. |
| N. M. de Vasconcellos and M. Yoshimura, "Life cycle cost model for
acquisition of automated systems," International Journal of Production
Research, Vol. 37, No. 9, 2059-2076, 1999. |
| S. Y. Wei, C. C. Lo, and C. A. Chang, "Using Throughput Profit For
Selecting Manufacturing Process Plan," Computers & Industrial
Engineering, Vol. 32, No. 4, 939-948, 1997. |
| D. Yao, C. Blouin, M. Cavanaugh, G. Boldman, B. Alvarez, S. Miraglia, L. Hungerford, "Spare Parts Expense Management System [Semiconductor Manufacturing]," IEEE 2002 Advanced Semiconductor Manufacturing Conference (ASMC '02), 347-350, 2002. The authors are from IBM Microelectron. Div., Essex Junction, VT. |
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