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Integrating Targeted Cycle-Time Reduction Into The Capital Planning Process
Authors:
Navdeep S. Grewal
Wafer Systems Engineering
Seagate Technology,
One Disc Drive
Bloomington, MN 55435, U.S.A.
Alvin C. Bruska
Wafer Systems Engineering
Seagate Technology,
One Disc Drive
Bloomington, MN 55435, U.S.A.
Timbur M. Wulf
Wafer Systems Engineering
Seagate Technology,
One Disc Drive
Bloomington, MN 55435, U.S.A.
Jennifer Robinson
Abstract:
This paper describes the development and application of an integrated static capacity
and dynamic simulation analysis methodology for purchasing equipment capacity. The goal of
the study is to address targeted cycle time objectives in a start up Recording Head Wafer
manufacturing facility at Seagate Technology, Minneapolis, MN. The short product cycle
time, coupled with the competitive nature of the disc drive industry, has made cycle time
reduction one of the most important objectives of production capacity planning. This paper
describes an equipment procurement strategy in which static capacity analysis is used to
identify an initial equipment set with a low slack capacity variable on each tool group.
Simulation analysis is then used to identify the critical tool groups that contribute to
cycle time delays. The Seagate Industrial Engineering team used the simulation analysis
tool Factory Explorer® from Wright, Williams & Kelly to perform the cycle time
reduction analysis. This targeted approach is compared to the traditional static capacity
planning approach of globally applying reserve capacity buffers of 20% or more to achieve
the same cycle time reduction goal. Overall, the targeted approach has proven to be
efficient in terms of minimizing capital equipment expenditures and also effective on the
factory floor.
Keywords:
Manufacturing simulation; Semiconductor manufacturing; Cycle time reduction
Availability:
A PDF version of this document is available from the fourth author. This document was
published in the Proceedings of the 1998 Winter Simulation Conference, Washington,
DC D. J. Medeiros, E. F. Watson, J. S. Carson, and M. S. Manivannan, eds, 1005-1010.
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